• Fundamental Concepts in DIC Microscopy

    Through a mechanism different from phase contrast, differential interference contrast converts specimen optical path gradients in o amplitude differences that can be visualized as improved contrast in the resulting image.

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  • Brief Overview of DIC Microscopy

    In the mid-1950s, a French optics theoretician named Georges Nomarski modified the Wollaston prism used for detecting optical gradients in specimens and converting them in o intensity differences.

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  • Darkfield Microscope Configuration

    The following section reviews the steps in the configuration and alignment of a microscope for both low and high magnification transmitted darkfield illumination.

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  • Reflected Darkfield Illumination

    One of the most effective ways to improve contrast in the reflected light microscope is to utilize darkfield illumination. In reflected darkfield microscopy, an opaque occluding disk is placed in the path of the light traveling through the vertical illuminator so that only the peripheral rays of light reach the deflecting mirror.

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  • Transmitted Darkfield Illumination

    Allofusarequitefamiliarwiththeappearanceandvisibilityofstarsonadarknight,thisdespitetheirenormousdistancesfromtheEarth.

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  • Contrast in Optical Microscopy

    When imaging specimens in the optical microscope, differences in intensity and/or color create image contrast, which allows individual features and details of the specimen to become visible. Contrast is defined as the difference in light intensity between the image and the adjacent background relative to the overall background intensity. In general, a minimum contrast value of 0.02 (2 percent) is needed by the human eye to distinguish differences between the image and its background.

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  • Microscopy ergonomics

    Upon walking in o a busy laboratory it isn't unusual to see microscopes sitting on books, tilted at odd angles, and otherwise precariously supported in a variety of positions to accommodate their users.

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  • Reflected Light Microscopy

    Reflected light microscopy is often referred to as incident light, epi-illumination, or metallurgical microscopy, and is the method of choice for fluorescence and for imaging specimens that remain opaque even when ground to a thickness of 30 microns.

    2018-04-13 Pooher Inc. 207

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